SWS-100 Wafer Sorting System

中文

Semiconductor packaging and testing equipment

Release time:2022-04-14

Product Information

− UPH >2000

− AOI inspection for wafer surface defective Vision

− Electric resistance testing

− Wafer thickness measurement

− Wafer size : 5/6 inch

− Supported：SECS/GEM

− MTBA : 60 min

− MTBF : 168 hrs

− Foot print : H1700 x W2200 x L8400mm

− Net weight : 6000kg

Pre： SWA-120 Inline Wafer AOI System

Next： SFB-150 Inline Flipper System

Products & Services

· Semiconductor packaging and testing equipment

· Medical solar equipment

· Industrial automation equipment

· Other services

With rich industry knowledge and project practical experience, the company has established a mature project implementation and management methodology system.

ADD：BLK 5 Xinhua industry park, No.2 Shuangma St SIP Suzhou China

TEL：+86-512-62870852

EM：sim@simtechco.com

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